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　　案。

　　核反應堆(dui)(dui)容量式熱交(jiao)換器設(she)(she)立4塊固定不動堆(dui)(dui)芯金(jin)邊吊蘭的定位(wei)鍵，如。辨別(bie)分配在筒節090180270部位(wei)。其作用是堆(dui)(dui)內(nei)構件(jian)設(she)(she)備時(shi)，確保(bao)頂(ding)蓋(gai)(gai)驅動器管(guan)座孔(kong)(kong)(kong)與堆(dui)(dui)內(nei)構件(jian)孔(kong)(kong)(kong)同軸度要(yao)求。設(she)(she)計方案要(yao)求堆(dui)(dui)內(nei)構件(jian)靠定位(wei)鍵定位(wei)、設(she)(she)備后與頂(ding)蓋(gai)(gai)開(kai)展電(dian)子光學對中，確保(bao)頂(ding)蓋(gai)(gai)管(guan)座孔(kong)(kong)(kong)與堆(dui)(dui)內(nei)構件(jian)孔(kong)(kong)(kong)同軸度要(yao)求：管(guan)理(li)中心孔(kong)(kong)(kong)準予(yu)誤(wu)差為0.30mm，相匹配旁(pang)邊的4個孔(kong)(kong)(kong)準予(yu)誤(wu)差為0.60mm，如。

　　1加工工藝分析與方案科學(xue)研究(jiu)為了更好地(di)能(neng)(neng)確保(bao)管(guan)座(zuo)孔(kong)與堆內(nei)構(gou)件孔(kong)同(tong)軸度要(yao)(yao)求。應能(neng)(neng)恰當地(di)檢驗(yan)(yan)出(chu)管(guan)座(zuo)孔(kong)跟堆內(nei)構(gou)件孔(kong)的(de)肯定部位，但器皿盒蓋后(hou)(hou)，堆內(nei)構(gou)件處在密閉式器皿內(nei)，通例檢驗(yan)(yan)方式跟測試工具無(wu)可奈何開展檢驗(yan)(yan)，應研制(zhi)開發一(yi)套非(fei)接(jie)觸式電子光學(xue)測量管(guan)理體系(xi)來測量孔(kong)距精密度。次(ci)之應能(neng)(neng)確保(bao)定位鍵的(de)設(she)備精密度，使(shi)其安裝(zhuang)后(hou)(hou)堆內(nei)構(gou)件能(neng)(neng)隨意(yi)成功、無(wu)卡滯(zhi)的(de)沿定位鍵落在器皿支(zhi)撐點(dian)臺(tai)肩(jian)膀，確保(bao)二者的(de)間(jian)隙在設(she)計方案要(yao)(yao)求中(zhong)間(jian)，另(ling)外也要(yao)(yao)令人滿意(yi)頂蓋管(guan)座(zuo)孔(kong)與堆內(nei)構(gou)件孔(kong)的(de)同(tong)軸度要(yao)(yao)求。

　　1.1高精(jing)密非接觸式電子(zi)光(guang)學測量(liang)管(guan)(guan)理體系為(wei)了更好地恰當地檢驗(yan)出管(guan)(guan)座孔(kong)與堆內構件(jian)孔(kong)的(de)對(dui)稱度(du)，我們(men)采用了測量(liang)精(jing)密度(du)較(jiao)為(wei)高的(de)聯(lian)線(xian)法開展(zhan)(zhan)測量(liang)。方式是(shi)在管(guan)(guan)座012孔(kong)及(ji)堆內構件(jian)上、下(xia)(xia)板肯定(ding)應的(de)孔(kong)上辨別(bie)設定(ding)靶點，靶點以(yi)具體孔(kong)尺(chi)寸公(gong)差配作(zuo)以(yi)發展(zhan)(zhan)相互配合精(jing)密度(du)。測量(liang)時以(yi)堆內構件(jian)上、下(xia)(xia)板兩靶點為(wei)標準定(ding)中心線(xian)，檢驗(yan)頂蓋管(guan)(guan)座孔(kong)靶點的(de)肯定(ding)部位(wei)。

　　1.2定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)的設備(bei)方案在(zai)(zai)臺器(qi)(qi)皿安裝時，定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)的生產(chan)加工(gong)(gong)(gong)(gong)方式是：定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)鍵(jian)(jian)(jian)寬規格(ge)先生產(chan)加工(gong)(gong)(gong)(gong)到量(liang)，銷(xiao)孔(kong)暫未生產(chan)加工(gong)(gong)(gong)(gong)，在(zai)(zai)廠內開(kai)(kai)展(zhan)(zhan)電子光學(xue)對中，靠(kao)定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)的把(ba)合外螺(luo)紋的外螺(luo)紋間隙調(diao)濟模(mo)版，在(zai)(zai)令人滿意頂蓋管座孔(kong)與模(mo)版孔(kong)同軸度要求(qiu)后，同生產(chan)加工(gong)(gong)(gong)(gong)定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)與筒(tong)節的銷(xiao)孔(kong)，裝定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)銷(xiao)。待器(qi)(qi)皿到造(zao)(zao)船廠開(kai)(kai)展(zhan)(zhan)復查時創造(zao)(zao)發(fa)明定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)造(zao)(zao)成(cheng)了歪斜(xie)，模(mo)版及(ji)堆(dui)內構件(jian)均無可奈何畸型(xing)設備(bei)及(ji)時，造(zao)(zao)成(cheng)卡滯(zhi)景色。分析起由于(yu)定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)在(zai)(zai)數(shu)控車床上(shang)生產(chan)加工(gong)(gong)(gong)(gong)銷(xiao)孔(kong)時，定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)造(zao)(zao)成(cheng)松脫，導致(zhi)定(ding)(ding)(ding)(ding)位(wei)(wei)(wei)鍵(jian)(jian)(jian)歪斜(xie)而致(zhi)。

　　糾正方(fang)式是先制作工(gong)(gong)藝(yi)鍵(jian)，銷(xiao)(xiao)孔(kong)按具體(ti)部位(wei)(wei)與筒(tong)節銷(xiao)(xiao)孔(kong)在(zai)數控車床高度(du)一(yi)致生產加(jia)(jia)(jia)工(gong)(gong)，因在(zai)生產加(jia)(jia)(jia)工(gong)(gong)進(jin)程中定(ding)(ding)(ding)位(wei)(wei)鍵(jian)的(de)(de)松脫(tuo)防止不上，必然導致定(ding)(ding)(ding)位(wei)(wei)鍵(jian)的(de)(de)歪斜，因此(ci) 定(ding)(ding)(ding)位(wei)(wei)鍵(jian)與筒(tong)節在(zai)裝銷(xiao)(xiao)定(ding)(ding)(ding)位(wei)(wei)后需對鍵(jian)側開(kai)(kai)展改動，確保(bao)定(ding)(ding)(ding)位(wei)(wei)鍵(jian)鍵(jian)側與器皿支撐點(dian)臺肩(jian)的(de)(de)平(ping)整度(du)在(zai)一(yi)定(ding)(ding)(ding)誤(wu)差之內。此(ci)外定(ding)(ding)(ding)位(wei)(wei)鍵(jian)的(de)(de)鍵(jian)側流量(liang)，在(zai)造船廠與堆內構(gou)件(jian)(jian)開(kai)(kai)展對中檢(jian)驗(yan)，因加(jia)(jia)(jia)工(gong)(gong)工(gong)(gong)藝(yi)鍵(jian)與堆內構(gou)件(jian)(jian)健(jian)(jian)槽有(you)(you)非常(chang)大間(jian)隙，檢(jian)驗(yan)進(jin)程中很有(you)(you)可能對堆內構(gou)件(jian)(jian)開(kai)(kai)展調整，以確保(bao)管座孔(kong)與堆內構(gou)件(jian)(jian)孔(kong)的(de)(de)同軸度(du)要求。檢(jian)驗(yan)成(cheng)績及格后評測加(jia)(jia)(jia)工(gong)(gong)工(gong)(gong)藝(yi)鍵(jian)與堆內構(gou)件(jian)(jian)健(jian)(jian)槽的(de)(de)間(jian)隙，生產加(jia)(jia)(jia)工(gong)(gong)商品鍵(jian)。此(ci)方(fang)案經幾臺器皿的(de)(de)設(she)備具體(ti)，不良影(ying)響(xiang)非常(chang)好。

　　2定(ding)位(wei)鍵(jian)(jian)(jian)設(she)備(bei)進程中(zhong)的誤(wu)差分(fen)析(xi)商品鍵(jian)(jian)(jian)生產(chan)加(jia)工(gong)后應另外確保2個指標值，一是定(ding)位(wei)鍵(jian)(jian)(jian)鍵(jian)(jian)(jian)側與(yu)堆內(nei)構(gou)件健槽間隙應在設(she)計方案要(yao)求(qiu)中(zhong)間，二(er)是令人(ren)滿意電子光學對之后同軸度要(yao)求(qiu)。因此以加(jia)工(gong)工(gong)藝鍵(jian)(jian)(jian)為標準(zhun)生產(chan)加(jia)工(gong)商品鍵(jian)(jian)(jian)的進程就至關重要(yao)。

　　2.1定位(wei)(wei)鍵(jian)(jian)設(she)備(bei)(bei)進(jin)(jin)(jin)程(cheng)(cheng)中(zhong)(zhong)的(de)(de)(de)誤(wu)(wu)差分析定位(wei)(wei)鍵(jian)(jian)的(de)(de)(de)設(she)備(bei)(bei)進(jin)(jin)(jin)程(cheng)(cheng)是(shi)：堆內(nei)(nei)構(gou)(gou)件就(jiu)坐落(luo)(luo)于器皿(min)支撐點(dian)臺肩膀(bang)，裝(zhuang)2個導向(xiang)性定位(wei)(wei)栓，然后(hou)(hou)頂(ding)蓋沿導向(xiang)性定位(wei)(wei)栓落(luo)(luo)裝(zhuang)，再開(kai)展電(dian)子光學檢驗。此進(jin)(jin)(jin)程(cheng)(cheng)蔓延到(dao)的(de)(de)(de)誤(wu)(wu)差影(ying)響因素許多 ，有(you)頂(ding)蓋起(qi)吊進(jin)(jin)(jin)程(cheng)(cheng)中(zhong)(zhong)的(de)(de)(de)反(fan)復定位(wei)(wei)誤(wu)(wu)差，有(you)堆內(nei)(nei)構(gou)(gou)件反(fan)復安裝(zhuang)進(jin)(jin)(jin)程(cheng)(cheng)的(de)(de)(de)定位(wei)(wei)誤(wu)(wu)差，也(ye)是(shi)有(you)電(dian)子光學對(dui)(dui)中(zhong)(zhong)檢測中(zhong)(zhong)的(de)(de)(de)測量誤(wu)(wu)差，此外也(ye)有(you)定位(wei)(wei)鍵(jian)(jian)的(de)(de)(de)生(sheng)產加(jia)工(gong)誤(wu)(wu)差。之上眾(zhong)多要素的(de)(de)(de)危害有(you)時候就(jiu)算是(shi)加(jia)工(gong)工(gong)藝鍵(jian)(jian)對(dui)(dui)中(zhong)(zhong)檢驗成(cheng)績(ji)及(ji)格(ge)，商(shang)品鍵(jian)(jian)的(de)(de)(de)對(dui)(dui)中(zhong)(zhong)檢驗也(ye)不一(yi)定成(cheng)績(ji)及(ji)格(ge)，這時候就(jiu)務必使加(jia)工(gong)工(gong)藝鍵(jian)(jian)的(de)(de)(de)對(dui)(dui)中(zhong)(zhong)檢驗誤(wu)(wu)差盡可能(neng)的(de)(de)(de)小，為事(shi)后(hou)(hou)的(de)(de)(de)頂(ding)蓋及(ji)堆內(nei)(nei)構(gou)(gou)件的(de)(de)(de)二次安裝(zhuang)等誤(wu)(wu)差空(kong)出充足的(de)(de)(de)誤(wu)(wu)差空(kong)間(jian)，促使商(shang)品鍵(jian)(jian)在對(dui)(dui)中(zhong)(zhong)檢驗時就(jiu)算總計了所述(shu)誤(wu)(wu)差也(ye)在成(cheng)績(ji)及(ji)格(ge)的(de)(de)(de)范圍內(nei)(nei)。

　　2.2頂(ding)蓋(gai)起吊進程中(zhong)(zhong)的(de)(de)(de)反復定位(wei)(wei)(wei)誤(wu)(wu)差(cha)頂(ding)蓋(gai)、筒節與導向(xiang)性(xing)定位(wei)(wei)(wei)栓(shuan)相互配合(he)的(de)(de)(de)位(wei)(wei)(wei)置，因(yin)工(gong)程圖紙得出的(de)(de)(de)尺寸公差(cha)是(shi)間(jian)(jian)隙(xi)(xi)(xi)相互配合(he)，因(yin)此 頂(ding)蓋(gai)導向(xiang)性(xing)定位(wei)(wei)(wei)栓(shuan)孔(kong)與導向(xiang)性(xing)定位(wei)(wei)(wei)栓(shuan)、筒節080及0120段都和導向(xiang)性(xing)定位(wei)(wei)(wei)栓(shuan)有(you)間(jian)(jian)隙(xi)(xi)(xi)，其(qi)較(jiao)大 的(de)(de)(de)定位(wei)(wei)(wei)誤(wu)(wu)差(cha)按(an)分(fen)(fen)別的(de)(de)(de)具體(ti)生(sheng)產加工(gong)規格來開展籌(chou)算。以(yi)筒節為(wei)(wei)標(biao)(biao)準(zhun)開展籌(chou)算，觀點(dian)是(shi)以(yi)筒節為(wei)(wei)標(biao)(biao)準(zhun)頂(ding)蓋(gai)因(yin)反復落裝(zhuang)(zhuang)而造成(cheng)的(de)(de)(de)限誤(wu)(wu)差(cha)為(wei)(wei)0.095毫(hao)米(mi). 2.3堆(dui)內(nei)(nei)(nei)構(gou)件反復安裝(zhuang)(zhuang)進程的(de)(de)(de)定位(wei)(wei)(wei)誤(wu)(wu)差(cha)堆(dui)內(nei)(nei)(nei)構(gou)件健槽與商品定位(wei)(wei)(wei)鍵(jian)的(de)(de)(de)相互配合(he)間(jian)(jian)隙(xi)(xi)(xi)應確保在(zai)設計方案要求(qiu)(qiu)中(zhong)(zhong)間(jian)(jian)，為(wei)(wei)發展定位(wei)(wei)(wei)精密(mi)(mi)度(du)(du)(du)，在(zai)生(sheng)產加工(gong)商品鍵(jian)鍵(jian)寬時我們嚴苛掌權其(qi)標(biao)(biao)準(zhun)公差(cha)，確保其(qi)相互配合(he)間(jian)(jian)隙(xi)(xi)(xi)在(zai)劃分(fen)(fen)范圍內(nei)(nei)(nei)。堆(dui)內(nei)(nei)(nei)構(gou)件落裝(zhuang)(zhuang)時的(de)(de)(de)情況較(jiao)為(wei)(wei)繁雜(za)，根(gen)據(ju)前、后落裝(zhuang)(zhuang)的(de)(de)(de)部位(wei)(wei)(wei)較(jiao)為(wei)(wei)較(jiao)有(you)平移(yi)變換(huan)進程，也是(shi)有(you)沿(yan)某一點(dian)轉動的(de)(de)(de)進程。經籌(chou)算其(qi)純平移(yi)變換(huan)進程的(de)(de)(de)定位(wei)(wei)(wei)誤(wu)(wu)差(cha)較(jiao)大 ，限誤(wu)(wu)差(cha)達到(dao)0.115毫(hao)米(mi). 2.4電(dian)子光(guang)學對(dui)中(zhong)(zhong)檢測(ce)(ce)中(zhong)(zhong)的(de)(de)(de)測(ce)(ce)量誤(wu)(wu)差(cha)經分(fen)(fen)析籌(chou)算，各(ge)種(zhong)各(ge)樣靶點(dian)定位(wei)(wei)(wei)圓柱體(ti)與管(guan)理(li)中(zhong)(zhong)心(xin)孔(kong)中(zhong)(zhong)間(jian)(jian)有(you)同軸(zhou)度(du)(du)(du)誤(wu)(wu)差(cha)，定位(wei)(wei)(wei)總(zong)體(ti)目標(biao)(biao)與被測(ce)(ce)孔(kong)有(you)相互配合(he)間(jian)(jian)隙(xi)(xi)(xi)，人的(de)(de)(de)眼睛開展估測(ce)(ce)查看(kan)有(you)誤(wu)(wu)差(cha)，籌(chou)算電(dian)子光(guang)學對(dui)中(zhong)(zhong)檢驗(yan)的(de)(de)(de)總(zong)測(ce)(ce)量誤(wu)(wu)差(cha)為(wei)(wei)低于0.02mm. 2.5總(zong)的(de)(de)(de)誤(wu)(wu)差(cha)分(fen)(fen)析根(gen)據(ju)所述(shu)各(ge)階段的(de)(de)(de)誤(wu)(wu)差(cha)分(fen)(fen)析，總(zong)的(de)(de)(de)誤(wu)(wu)差(cha)為(wei)(wei)0.23mm，而管(guan)理(li)中(zhong)(zhong)心(xin)孔(kong)的(de)(de)(de)準(zhun)予同軸(zhou)度(du)(du)(du)誤(wu)(wu)差(cha)為(wei)(wei)0.3毫(hao)米(mi)，這表明(ming)加工(gong)工(gong)藝(yi)鍵(jian)電(dian)子光(guang)學對(dui)里時的(de)(de)(de)同軸(zhou)度(du)(du)(du)誤(wu)(wu)差(cha)允許在(zai)0.07mm之(zhi)內(nei)(nei)(nei)能令人滿意商品鍵(jian)的(de)(de)(de)對(dui)中(zhong)(zhong)精密(mi)(mi)度(du)(du)(du)要求(qiu)(qiu)，但在(zai)具體(ti)安裝(zhuang)(zhuang)進程中(zhong)(zhong)限誤(wu)(wu)差(cha)另外(wai)造成(cheng)的(de)(de)(de)是(shi)多少率是(shi)十分(fen)(fen)小，因(yin)而加工(gong)工(gong)藝(yi)鍵(jian)對(dui)里時的(de)(de)(de)同軸(zhou)度(du)(du)(du)誤(wu)(wu)差(cha)掌權在(zai)0.毫(hao)米(mi)誤(wu)(wu)差(cha)之(zhi)內(nei)(nei)(nei)就很有(you)可能令人滿意要求(qiu)(qiu)。

　　3總結為了更(geng)好(hao)地確保定位(wei)鍵設(she)(she)備精密度，采用了首先用加(jia)(jia)(jia)工工藝鍵電(dian)子(zi)光學對中(zhong)，然(ran)后根據加(jia)(jia)(jia)工工藝鍵對中(zhong)結果生產加(jia)(jia)(jia)工商品(pin)的(de)加(jia)(jia)(jia)工工藝方式來完成其對中(zhong)精密度，令人滿意了設(she)(she)計方案要求。此定位(wei)鍵設(she)(she)備方案是行得通的(de)，存有好(hao)用跟(gen)營銷推廣的(de)使用價值。